REFRACTIVE INDEX MEASURING METHOD, REFRACTIVE INDE

专利名称：REFRACTIVE INDEX MEASURING METHOD,

REFRACTIVE INDEX MEASURINGAPPARATUS, AND OPTICAL ELEMENTMANUFACTURING METHOD

发明人：Seima Kato申请号：US15089119申请日：20160401

公开号：US20160299066A1公开日：20161013

专利附图：

摘要：A refractive index measuring method includes measuring a transmitted

wavefront of a test object in each of a plurality of arrangements that differ from eachother in the position of the test object, estimating a plurality of refractive indices withregard to a reference test object having the same shape as that of the test object,calculating a transmitted wavefront when the reference test object is disposed in each ofthe plurality of arrangements with regard to each of the plurality of refractive indices,and calculating the refractive index of the test object using the transmitted wavefront ofthe test object and the transmitted wavefront calculated with regard to the referencetest object.

申请人：CANON KABUSHIKI KAISHA

地址：Tokyo JP

国籍：JP

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