专利名称：Measurement Device Control System for
Determining a Topology of a Surface of aBulk Material
发明人：Roland WELLE,Josef Fehrenbach申请号：US16418504申请日：20190521
公开号：US20190271581A1公开日：20190905
专利附图：
摘要：For determining the topology of a bulk material surface, a series of echo curvesare detected in different primary radiation directions of the antenna. In the process, the
primary radiation direction of the antenna is changed in such a way that all of thegenerated echo curves of the series of echo curves can be used for determining thetopology of the bulk material surface. As a result, the measurement time can be reduced.
申请人：VEGA Grieshaber KG
地址：Wolfach DE
国籍：DE
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