专利名称：LIST INSERTION IN TEST SEGMENTS WITH
NON-NATURALLY ALIGNED DATABOUNDARIES
发明人：Manoj Dusanapudi,Shakti Kapoor,Nelson Wu申请号：US15850201申请日：20171221
公开号：US20190198132A1公开日：20190627
专利附图：
摘要：A processor memory is stress tested with a variable list insertion depth usinglist insertion test segments with non-naturally aligned data boundaries. List insertion test
segments are interspersed into test code of a processor memory tests to change the listinsertion depth without changing results of the test code. The list insertion testsegments are the same structure as the segments of the test code and have non-naturally aligned boundaries. The list insertion test segments include list insertionsegments and load/store segments. The list insertion segments locate a current memorylocation using a fixed segment at a known location. The load/store segments load andstore list elements in memory.
申请人：International Business Machines Corporation
地址：Armonk NY US
国籍：US
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